Services
Advanced Materials Research
Advanced characterization of your novel materials.
Composition Analysis
We can measure the chemical properties of your materials. Elemental composition and bonding of bulk materials as well as elemental depth profiles of multi-component systems.
Methods of analysis
- Near surface composition (% level) and binding energy — XPS – ESCA
- Bulk elemental composition — SEM/EDS
- Composition and thickness of thin films on substrates — RBS
- Organic composition and molecular fingerprint identification — FTIR
- Thin film and trace contamination analysis — SIMS
Microstructure
Micro and macro crystallinity of your materials can be analyzed to provide understanding of changes in various growth parameters.
Methods of analysis
- Crystallinity (phase identification) and grain size analysis of bulk materials — XRD / XRR
- Micro-crystallinity (phase identification) — TEM – EDS/EELS
- Grain size and surface analysis — SEM/EDS
Surface Characterization
Surface analysis such as roughness and composition can be tested.