Proof
Case Studies
Representative examples of analytical testing workflows for contamination control, materials characterization, and regulatory support.
These are representative examples pending publication of real, client-approved case studies.
Trace Metal Contamination on Silicon Wafers
A representative wafer contamination investigation used VPD-ICPMS to help isolate surface metals associated with a process excursion. The work supported corrective action without disclosing client-specific process details.
Organic Outgassing and Airborne Molecular Contamination
A representative cleanroom materials screening project used ATD-GC-MS to identify volatile organic compounds linked to airborne molecular contamination concerns. The findings helped guide material selection and source-control actions.
Thin-Film Interface Defect Characterization
A representative thin-film failure analysis used TEM and STEM-EDS to characterize an interface defect in a multilayer stack. Imaging and elemental mapping clarified the morphology and composition of the affected region.
Residual TCE Testing Ahead of Regulatory Phase-Out
A representative chemical screening project used GC-MS to evaluate residual trichloroethylene concerns before a planned regulatory transition. The testing supported risk review and replacement-material qualification.